Test Systems

Test Systems Supported

TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.

Flying Probe

Seica Pilot V8

The Seica Pilot V8 represents the latest frontier in flying probe test technology for TTCI. Its vertical architecture optimizes test time by probing both sides of the UUT simultaneously. The Pilot V8 accommodates a wide range of solutions like vectorless and in-circuit, programming and functional, boundary scan, medium/high volumes of Circuit Card Assembly (CCA) testing, highly integrated prototypes, high-mixed products, boards not designed for testing, reverse engineering, and repair.

Digitaltest Condor MTS500

The Digitaltest Condor MTS500 is designed to provide a comprehensive prototype and production test for TTCI. The multi-faceted test system features rapid program development, high throughput, and the ability to handle large-printed circuit card assemblies. The system is designed to significantly improve electronics production line performance and efficiency while cutting manufacturing costs.

In-Circuit Test

Keysight 3070

In-Circuit Testing (ICT) is recommended for high-volume production and complex test requirements. Comprehensive test program development, high-quality fixtures, and efficient circuit card assembly testing make the Keysight 3070 a reliable ICT choice. TTCI test solutions can also integrate boundary scan, in-system programming, and flash RAM memory testing.

Teradyne TS12x/GR228x

Teradyne TS12x/GR228x ICT system provides full structural and functional coverage for a wide range of manufacturing, component, process, and performance defects for high-performance analog, digital, and mixed-signal devices used on modern CCAs. TTCI solutions can also integrate boundary scan testing, in-system programming, flash, and RAM memory testing.

Boundary Scan

Keysight X1149 Analyser

The Keysight x1149 Analyser is a tool for engineers to perform a structural test on their circuit card assembly. It also performs in-system programming for FPGAs and CPLDs. The x1149 Analyser programs Programmable Read-Only Memory (PROM) devices as well as execute memory verification tests on devices like the Double Data Rate Synchronous Dynamic Random-Access Memory (DDR SDRAMs). TTCI is a recognized Keysight Solution Partner that supports all of the X1149 boundary scan features with Keysight.

XJTAG

XJTAG as a standalone integrated boundary scan solution increases the test coverage and overcomes test access problems by verifying the JTAG chains, performing programming of FPGAs, CPLDs, and PROMs, and testing DDR RAM memories. TTCI is a recognized XJTAG Technology Partner that supports all of the XJTAG features with XJTAG-trained professionals and a reseller of XJTAG boundary scan solution.

Functional

Keysight TS-5000/TS-8900

The TS-5000 System uses Keysight TestExcel SL and system-specific software for the Unit Under Test (UUT). TestExcel SL is a test executive designed for high-volume, high-throughput functional test applications. The other system-specific software provides the communications between the test executive and system instruments. The TS-8900 is a PXI-based, off-the-shelf functional test platform for medium- to high-pin count automotive Electronic Control Unit (ECU) manufacturing that provides customers with higher throughput and improved coverage solutions compared to current generation test systems while maintaining a global deployment. TTCI offers local solutions and global support with Keysight.